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1

Novel fully silicided ballasting and MFT design techniques for ESD protection in advanced deep sub-micron CMOS technologies

Koen G Verhaege, Christian C Russ

Journal:

Microelectronics Reliability

Year:

2001

Language:

english

File:

PDF, 747 KB

english, 2001

2

[ESD Assoc Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 - Anaheim, CA, USA (26-28 Sept. 2000)] Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) - TLP calibration, correlation, standards, and new techniques [ESD test]

Barth, J., Verhaege, K., Henry, L.G., Richner, J.

Year:

2000

Language:

english

File:

PDF, 1.02 MB

english, 2000

3

Influence of tester, test method, and device type on CDM ESD testing

Verhaege, K., Groeseneken, G.V., Maes, H.E., Egger, P., Gieser, H.

Journal:

IEEE Transactions on Components Packaging and Manufacturing Technology Part A

Year:

1995

Language:

english

File:

PDF, 1.11 MB

english, 1995

4

Justifications for reducing HBM and MM ESD qualification test time

K. Verhaege, D. Robinson-Hahn, C. Russ, M. Farris, J. Scanlon, D. Lin, J. Veltri, G. Groeseneken

Journal:

Microelectronics Reliability

Year:

1996

Language:

english

File:

PDF, 319 KB

english, 1996

5

ESD protection solutions for high voltage technologies

Bart Keppens, Markus P.J. Mergens, Cong Son Trinh, Christian C. Russ, Benjamin Van Camp, Koen G. Verhaege

Journal:

Microelectronics Reliability

Year:

2006

Language:

english

File:

PDF, 729 KB

english, 2006

6

Investigation into socketed CDM (SDM) tester parasitics

M Chaine, K Verhaege, L Avery, M Kelly, H Gieser, K Bock, L.G Henry, T Meuse, T Brodbeck, J Barth

Journal:

Microelectronics Reliability

Year:

1999

Language:

english

File:

PDF, 278 KB

english, 1999

7

TLP calibration, correlation, standards, and new techniques

Barth, J.E., Verhaege, K., Henry, L.G., Richner, J.

Journal:

IEEE Transactions on Electronics Packaging Manufacturing

Year:

2001

Language:

english

File:

PDF, 196 KB

english, 2001

8

Electrochemical oxidation of 1,4-dioxane at boron-doped diamond electrode

Jeriffa De Clercq, Evelien Van de Steene, Kim Verbeken, Marc Verhaege

Journal:

Journal of Chemical Technology & Biotechnology

Year:

2010

Language:

english

File:

PDF, 314 KB

english, 2010

9

Simulation study for the CDM ESD behaviour of the grounded-gate nmos

C. Russ, K. Verhaege, K. Bock, G. Groeseneken, H.E. Maes

Journal:

Microelectronics Reliability

Year:

1996

Language:

english

File:

PDF, 320 KB

english, 1996

10

Novel design of driver and ESD transistors with significantly reduced silicon area

Koen G Verhaege, Markus Mergens, Christian Russ, John Armer, Phillip Jozwiak

Journal:

Microelectronics Reliability

Year:

2002

Language:

english

File:

PDF, 772 KB

english, 2002

11

High holding current SCRs (HHI-SCR) for ESD protection and latch-up immune IC operation

Markus P.J. Mergens, Christian C. Russ, Koen G. Verhaege, John Armer, Phillip C. Jozwiak, Russ Mohn

Journal:

Microelectronics Reliability

Year:

2003

Language:

english

File:

PDF, 576 KB

english, 2003

12

Multi-finger turn-on circuits and design techniques for enhanced ESD performance and width scaling

S. Trinh, M. Mergens, K. Verhaege, C. Russ, J. Armer, P. Jozwiak, B. Keppens, R. Mohn, G. Taylor, F. De Ranter, B. Van Camp

Journal:

Microelectronics Reliability

Year:

2003

File:

PDF, 1.59 MB

2003

13

Component level ESD testing

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 476 KB

english, 1998

14

ESD protection elements during hbm stress tests—further numerical and experimental results

Christian Russ, Horst Gieser, Koen Verhaege

Journal:

Quality and Reliability Engineering International

Year:

1995

Language:

english

File:

PDF, 856 KB

english, 1995

15

Grounded-gate nMOS transistor behavior under CDM ESD stress conditions

Verhaege, K., Russ, C., Luchies, J.-M., Groeseneken, G., Kuper, F.G.

Journal:

IEEE Transactions on Electron Devices

Year:

1997

Language:

english

File:

PDF, 196 KB

english, 1997

16

Towards the superconducting fault current limiter

Thuries, E., Pham, V.D., Laumond, Y., Verhaege, T., Fevrier, A., Collet, M., Bekhaled, M.

Journal:

IEEE Transactions on Power Delivery

Year:

1991

Language:

english

File:

PDF, 729 KB

english, 1991

17

[ESD Assoc 18th Annual Electrical Overstress/Electrostatic Discharge Symposium - Orlando, FL, USA (10-12 Sept. 1996)] Proceedings Electrical Overstress/Electrostatic Discharge Symposium - Recommendations to further improvements of HBM ESD component level test specifications

Verhaege, K., Russ, C., Robinson-Hahn, D., Farris, M., Scanlon, J., Lin, D., Veltri, J., Groeseneken, G.

Year:

1996

Language:

english

File:

PDF, 1.40 MB

english, 1996

18

Speed optimized diode-triggered SCR (DTSCR) for RF ESD protection of ultra-sensitive IC nodes in advanced technologies

Mergens, M.P.J., Russ, C.C., Verhaege, K.G., Armer, J., Jozwiak, P.C., Mohn, R.P., Keppens, B., Trinh, C.S.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2005

Language:

english

File:

PDF, 1.04 MB

english, 2005

19

[IEEE 2005 IEEE International Symposium on Circuits and Systems - Kobe, Japan (23-26 May 2005)] 2005 IEEE International Symposium on Circuits and Systems - ESD protection circuit design for ultra-sensitive IO applications in advanced sub-90nm CMOS technologies

Mergens, M., Wybo, G., Van Camp, B., Keppens, B., De Ranter, F., Verhaege, K., Jozwiak, P., Armer, J., Russ, C.

Year:

2005

Language:

english

File:

PDF, 358 KB

english, 2005

20

The ESD protection mechanisms and the related failure modes and mechanisms observed in SOI snapback nMOSFET's

Koen Verhaege, Guido Groeseneken, Jean-Pierre Colinge, Herman E. Maes

Journal:

Microelectronics Reliability

Year:

1995

Language:

english

File:

PDF, 504 KB

english, 1995

21

Editorial

Koen G. Verhaege

Journal:

Microelectronics Reliability

Year:

2001

Language:

english

File:

PDF, 23 KB

english, 2001

22

Ride-through of adjustable speed drives during voltage dips

Kurt Stockman, Frederik D'hulster, Kevin Verhaege, Marcel Didden, Ronnie Belmans

Journal:

Electric Power Systems Research

Year:

2003

Language:

english

File:

PDF, 1.00 MB

english, 2003

23

Influence of the chloride concentration on the distribution and separation of zinc and cadmium by means of solvent extraction with carboxylic acids

Journal:

Hydrometallurgy

Year:

1975

Language:

english

File:

PDF, 186 KB

english, 1975

24

Protection of superconducting AC windings

Verhaege, T., Agnoux, C., Tavergnier, J.P., Lacaze, A., Collet, M.

Journal:

IEEE Transactions on Magnetics

Year:

1992

Language:

english

File:

PDF, 350 KB

english, 1992

25

Coil performances of superconducting cables of AC applications

Lacaze, A., Laumond, Y., Bonnet, P., Fevrier, A., Verhaege, T., Ansart, A.

Journal:

IEEE Transactions on Magnetics

Year:

1992

Language:

english

File:

PDF, 333 KB

english, 1992

26

Reduction of AC losses in ultra-fine multifilamentary NbTi wires

Cave, J.R., Fevrier, A., Verhaege, T., Lacaze, A., Laumond, Y.

Journal:

IEEE Transactions on Magnetics

Year:

1989

Language:

english

File:

PDF, 455 KB

english, 1989

27

Removal of nitrate in aquaria by means of electrochemically generated hydrogen gas as electron donor for biological denitrification

R. Grommen, M. Verhaege, W. Verstraete

Journal:

Aquacultural Engineering

Year:

2006

Language:

english

File:

PDF, 189 KB

english, 2006

28

Biofuel Cells Select for Microbial Consortia That Self-Mediate Electron Transfer

Rabaey, K., Boon, N., Siciliano, S. D., Verhaege, M., Verstraete, W.

Journal:

Applied and Environmental Microbiology

Year:

2004

Language:

english

File:

PDF, 766 KB

english, 2004

29

[ESD Assoc Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 - Anaheim, CA, USA (26-28 Sept. 2000)] Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) - Wafer cost reduction through design of high performance fully silicided ESD devices

Verhaege, K.G., Russ, C.C.

Year:

2000

Language:

english

File:

PDF, 900 KB

english, 2000

30

[ESD Assoc 18th Annual Electrical Overstress/Electrostatic Discharge Symposium - Orlando, FL, USA (10-12 Sept. 1996)] Proceedings Electrical Overstress/Electrostatic Discharge Symposium - A compact model for the grounded-gate nMOS behaviour under CDM ESD stress

Russ, C., Verhaege, K., Bock, K., Roussel, P.J., Groeseneken, G., Maes, H.E.

Year:

1996

Language:

english

File:

PDF, 1.43 MB

english, 1996

31

[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - Diode-triggered SCR (DTSCR) for RF-ESD protection of BiCMOS SiGe HBTs and CMOS ultra-thin gate oxides

Mergens, M.P.J., Russ, C.C., Verhaege, K.G., Armer, J., Jozwiak, P.C., Mohn, R., Keppens, B., Trinh, C.S.

Year:

2003

Language:

english

File:

PDF, 339 KB

english, 2003

32

[IEEE Proceedings of the IEEE 2004 Custom Integrated Circuits Conference - Orlando, FL, USA (3-6 Oct. 2004)] Proceedings of the IEEE 2004 Custom Integrated Circuits Conference (IEEE Cat. No.04CH37571) - Active-source-pump (ASP) technique for ESD design window expansion and ultra-thin gate oxide protection in sub-90nm technologies

Mergens, M., Armer, J., Jozwiak, P., Keppens, B., De Ranter, F., Verhaege, K., Kumar, R.

Year:

2004

Language:

english

File:

PDF, 449 KB

english, 2004

33

Double snapback in SOI nMOSFETs and its application for SOI ESD protection

Verhaege, K., Groeseneken, G., Colinge, J.-P., Maes, H.E.

Journal:

IEEE Electron Device Letters

Year:

1993

Language:

english

File:

PDF, 270 KB

english, 1993

34

[IEEE 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - Enschede, The Netherlands (8-11 October 1996)] Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - Justifications for reducing HBM and MM ESD qualification test time

Verhaege, K., Robinson-Hahn, D., Russ, C., Farris, M., Scanlon, J., D. Lin,, Veltri, J., Groenseneken, G.

Year:

1996

Language:

english

File:

PDF, 329 KB

english, 1996

35

AC current distribution and losses in multifilamentary superconductors exposed to longitudinal magnetic field

Le Naour, S., Lacaze, A., Laumond, Y., Estop, P., Verhaege, T.

Journal:

IEEE Transactions on Magnetics

Year:

1996

Language:

english

File:

PDF, 346 KB

english, 1996

36

Progress on superconducting current limitation project for the French electrical grid

Verhaege, T., Cottevieille, C., Weber, W., Thomas, P., Therond, P.G., Laumond, Y., Bekhaled, M., Pham, V.D.

Journal:

IEEE Transactions on Magnetics

Year:

1994

Language:

english

File:

PDF, 424 KB

english, 1994

37

A new step in AC superconducting conductors

Verhaege, T., Estop, P., Tavergnier, J.P., Bonnet, P., Lacaze, A., Laumond, Y., Ansart, A.

Journal:

IEEE Transactions on Magnetics

Year:

1994

Language:

english

File:

PDF, 470 KB

english, 1994

38

Coils performances of superconducting cables for 50/60 Hz applications

Lacaze, A., Laumond, Y., Tavergnier, A., Verhaege, T., Dalle, B., Ansart, A.

Journal:

IEEE Transactions on Magnetics

Year:

1991

Language:

english

File:

PDF, 387 KB

english, 1991

39

[IEEE 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - Enschede, The Netherlands (8-11 October 1996)] Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - Simulation study for the CDM ESD behaviour of the grounded-gate NMOS

Russ, C., Verhaege, K., Bock, K., Groeseneken, G., Maes, H.E.

Year:

1996

Language:

english

File:

PDF, 323 KB

english, 1996

40

Microglial activation arises after aggregation of phosphorylated-tau in a neuron-specific P301S tauopathy mouse model

van Olst, Lynn, Verhaege, Daan, Franssen, Marc, Kamermans, Alwin, Roucourt, Bart, Carmans, Sofie, Ytebrouck, Ellen, van der Pol, Susanne M.A., Wever, Dennis, Popovic, Marko, Vandenbroucke, Roosmarijn

Journal:

Neurobiology of Aging

Year:

2020

Language:

english

File:

PDF, 4.96 MB

english, 2020

41

Diluent Influence on the Extraction of some Transition Metalchloride Complexes with Triïsoöctylamine

M. Verhaege, G. Claus, A. van Peteghem

Journal:

Bulletin des Sociétés Chimiques Belges

Year:

1982

Language:

english

File:

PDF, 72 KB

english, 1982

42

Liquid-Liquid Extraction of Chromium (VI) from Diluted Chromicacid Containing Solutions

M. Verhaege, J. Sinnesael, A. van Peteghem

Journal:

Bulletin des Sociétés Chimiques Belges

Year:

1984

Language:

english

File:

PDF, 62 KB

english, 1984

43

Cobalt removal from waste-water by means of supported liquid membranes

Kim Verbeken, Bruno Vanheule, Luc Pinoy, Marc Verhaege

Journal:

Journal of Chemical Technology & Biotechnology

Year:

2009

Language:

english

File:

PDF, 147 KB

english, 2009

44

Electrochemical decomplexing and oxidation of organic (chelating) additives in effluents from surface treatment and metal finishing

Geert Lissens, Marc Verhaege, Luc Pinoy, Willy Verstraete

Journal:

Journal of Chemical Technology & Biotechnology

Year:

2003

Language:

english

File:

PDF, 180 KB

english, 2003

45

Current transfer conditions from a metallic conductor to a high Tc superconductor

P.F. Herrmann, E. Beghin, J. Bouthegourd, C. Cottevieille, G. Duperray, F. Grivon, A. Leriche, V. Winter, T. Verhaege

Journal:

Year:

1993

Language:

english

File:

PDF, 634 KB

english, 1993

46

Cryogenic load calculation of high Tc current lead

P.F. Herrmann, C. Cottevieille, G. Duperray, A. Leriche, T. Verhaege, C. Albrecht, J. Bock

Journal:

Year:

1993

Language:

english

File:

PDF, 785 KB

english, 1993

47

Quantification of the amount of ɛ martensite in a Fe–Mn–Si–Cr–Ni shape memory alloy by means of electron backscatter diffraction

K. Verbeken, N. Van Caenegem, M. Verhaege

Journal:

Materials Science and Engineering: A

Year:

2008

Language:

english

File:

PDF, 685 KB

english, 2008

48

Josephson phase coherence and coupling in A15 granular superconductors

J.F. Beaudoin, F. Weiss, J.P. Senateur, T. Verhaege, P. Dubots

Journal:

Physica C: Superconductivity

Year:

1988

Language:

english

File:

PDF, 139 KB

english, 1988

49

Limitations on retrieval of complex refractive index of spherical particles from scattering measurements

Christophe Verhaege, Valery Shcherbakov, Pascal Personne

Journal:

Journal of Quantitative Spectroscopy and Radiative Transfer

Year:

2008

Language:

english

File:

PDF, 2.51 MB

english, 2008

50

Retrieval of complex refractive index and size distribution of spherical particles from Dual-Polarization Polar Nephelometer data

Christophe Verhaege, Valery Shcherbakov, Pascal Personne

Journal:

Journal of Quantitative Spectroscopy and Radiative Transfer

Year:

2009

Language:

english

File:

PDF, 496 KB

english, 2009

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